Investigations of the conduction mechanism and relaxation properties of semiconductor Sm doped a-Se films

Kotkata, MF; Abdel-Wahab, Fathy; Abd-El-Maksoud, , H.M;

Abstract


The ac and dc conductivities (σac and σ dc) of amorphous semiconductor Sm doped Se (namely, SeSm 0.005) films, prepared by thermal evaporation, were measured under vacuum in a wide range of frequency and temperature. The ac conductivity versus frequency plots were analysed by considering a power law: σac ∝ ωs (s ≤ 1). A comparison between values of the index s with those numerically calculated from different conduction models reveals that correlated barrier hopping (CBH) is a fairly good model to describe the dominant ac conduction mechanism. The concept of the Meyer-Neldel (MN) rule in the expression of the relaxation time is considered for both ac and dc experimental data. The validity of the CBH model based on the MN (normal and inverted) rule is studied and discussed. Besides, results of the real dielectric constant (ε′), loss factor (ε′) and loss tangent (tan δ) together with the Cole-Cole diagrams and the optical (ε∞) and static (εs) dielectric constants for a-SeSm0.005 films are given and discussed. © 2006 IOP Publishing Ltd.


Other data

Title Investigations of the conduction mechanism and relaxation properties of semiconductor Sm doped a-Se films
Authors Kotkata, MF; Abdel-Wahab, Fathy; Abd-El-Maksoud, , H.M 
Keywords MEYER-NELDEL RULE;DIELECTRIC-RELAXATION;PHASE-PROPERTY;HOPPING MODEL;FREQUENCY;CHALCOGENIDE;DC;SELENIUM
Issue Date 2006
Publisher IOP PUBLISHING LTD
Journal Journal of Physics D: Applied Physics 
Volume 39
Issue 10
ISSN 0022-3727
DOI 10.1088/0022-3727/39/10/013
Scopus ID 2-s2.0-33646729478
Web of science ID WOS:000238329100014

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